SIMS as a subnanometer probe: A new tool for chemical profile analysis of grafted molecules
F. Cherioux, B. Gauthier-Manuel, J. Eccles, T. Grenut, M. Briant
Applied Surface Science 253 2007 6140
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Development of a ToF version of the desktop MiniSIMS utilising a continuous primary ion beam
A.J. Eccles, P. Vohralik, B. Cliff, C. Jones, N. Long
Applied Surface Science 252 2006 7308
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Development of a ToF version of the desktop MiniSIMS: instrument design and applications
B. Cliff, A. J. Eccles, C. Jones, N. Long, P. Vohralik
Surface & Interface Analysis 38 2006 699
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Inhibition of corrosion-driven organic coating delamination on zinc by polyaniline
G. Williams, R.J. Holness, D.A. Worsley & H.N. McMurray Electrochemistry Communications 6 2004 549
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Rapid characterisation of surface modifications and treatments using a benchtop SIMS instrument
D.S. McPhail, M. Sokhana, E.E. Reesa, B. Cliff, A.J. Eccles & R.J. Chater Applied Surface Science 231-2 2004 967
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Laboratory teaching of SIMS to university undergraduates
R.J. Chater & D.S. McPhail Applied Surface Science 231-2 2004 141
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The application of a compact and low-cost SIMS instrument to the rapid identification of contamination in silicon IC processing
N. Long, A.J. Eccles & B. Cliff Advances in Electronics Manufacturing Technology Vertilog 2004 EMT1:1
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The kinetics of chloride-induced filiform corrosion on aluminum alloy AA2024-T3
G. Williams & H. N. McMurray Journal of the Electrochemical Society 150 (8) 2003 B380
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The mechanism of group (I) chloride initiated filiform corrosion on iron
G. Williams & H.N. McMurray Electrochemistry Communications 5 2003 871
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Application of SIMS to silver tarnish at the British Museum
K. Hallett, D. Thickett, D.S. McPhail & R.J. Chater Applied Surface Science 203-4 2003 789
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Fluoride uptake by glass ionomer cements: a surface analysis approach
F.H. Jones, B.M. Hutton, P.C. Hadley, A.J. Eccles, T.A. Steele, R.W. Billington & G.J. Pearson Biomaterials 24 2003 107
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Surface chemical derivatization of plasma-treated PET and PTFE
T.K. Markkula, J.A. Hunt, F.R. Pu & R.L. Williams Surface & Interface Analysis 34 2002 583
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Routine problem solving with the SIMS Chemical Microscope
A.J. Eccles & T.A. Steele International Journal Adhesion & Adhesives 21 2001 281
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Surface chemistry and wettability of plasma-treated PTFE
D.J. Wilson, A.J. Eccles, T.A. Steele, R.L. Williams & R.C. Pond Surface & Interface Analysis 30 2000 36
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Spectral differences and their interpretation for the identification of common polymers
A.J. Eccles, T.A. Steele & D. Briggs Proceedings SIMS XII, Eds. A. Benninghoven et al., Elsevier Amsterdam 2000 p. 781
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Recent development of the Chemical Microscope - a low-cost automated imaging SIMS instrument
A.J. Eccles & T.A. Steele Proceedings SIMS XII, Eds. A. Benninghoven et al., Elsevier Amsterdam 2000 p. 229
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SIMS analysis of conducting polypyrrole-silica gel composites
C. Perruchot, M.M. Chehimi, M. Delamar, A.J. Eccles, T.A. Steele & C.D. Mair Synthetic Metals 113 2000 53
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Influence of boron and nitrogen doping levels on the quality and morphology of CVD diamond
A.J. Eccles, T.A. Steele, A. Afzal, C.A. Rego, W. Ahmed, P.W. May & S.M. Leeds Thin Solid Films 343 1999 627
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Broadening the horizons of SIMS: the low-cost Chemical Microscope
A.J. Eccles, T.A. Steele & A.W. Robinson Applied Surface Science 144 1999 106
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Problem solving applications of a low-cost fully automated SIMS Chemical Microscope
A.J. Eccles & T.A. Steele Proceedings of SIMS XI, Eds. G. Gillen et al., John Wiley & Sons Chichester 1998 p. 775
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Monitoring Nanoscale Coatings