Millbrook Instruments Limited
MILLBROOK
Instruments Limited
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Capability
 

The Millbrook MiniSIMS uses Secondary Ion Mass Spectrometry (SIMS) to analyse the surface of a solid object.

 
Static SIMS (surface analysis)   
High energy primary ions are used to dislodge secondary ions from the surface molecular layers. These ions are analysed by mass spectrometry, producing a spectrum to identify both organic and inorganic species.
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 Static SIMS
 
Imaging SIMS (spatial analysis)   
Scanning the focused primary ion beam over the sample surface builds up an image showing the distribution of any species. This is ideal for analysing the uniformity of coatings or the composition of small features.
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 Imaging SIMS
 
Dynamic SIMS (depth analysis)   

By concentrating the primary beam into a small area, the surface layers are progressively etched away. This produces an analysis of the subsurface region, monitoring the thickness and composition of thin films.
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 Dynamic SIMS
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