The Millbrook MiniSIMS uses Secondary Ion Mass Spectrometry (SIMS) to analyse the surface of a solid object.
Static
SIMS (surface analysis)
High energy primary ions are used to dislodge secondary ions from the
surface molecular layers. These ions are analysed by mass spectrometry,
producing a spectrum to identify both organic and inorganic species. Show me an example
Imaging
SIMS (spatial analysis)
Scanning the focused primary ion beam over the sample surface builds
up an image showing the distribution of any species. This is ideal for
analysing the uniformity of coatings or the composition of small features. Show me an example
Dynamic
SIMS (depth analysis)
By concentrating the primary beam into a small area,
the surface layers are progressively etched away. This produces an analysis
of the subsurface region, monitoring the thickness and composition of
thin films. Show me an example