Etch Rate Calculation
This simple Excel spreadsheet performs the repetitive calculation of the etch rate per second for depth profiling analyses as the crater size and sputter yield of the material vary. It can also be used to estimate the time to reach the static SIMS limit for small area analysis.
 Etch Rate Excel file (16kb) |
Depth Profile Plotting
This macro based Excel spreadsheet will read in a depth profile data file and plot up to 10 masses on auto-scaled axes. There is also the facility to change the horizontal axis from time to depth based on an estimated sputter yield.
 Depth Macro Version 2 Excel file Zipped (66kb) |
Peak Identification Database
This zip file contains the six files that comprise the latest version of the elemental database used for peak identification within the Millbrook data acquisition and processing software. The files should be extracted and placed in the same folder (directory) as the existing database files.
Latest Database Zip file (10kb) |
|
| Data & Training |
| |
Data Sheets
These data sheets are to supersede the original versions supplied with the instrument. They are tailored for the MiniSIMS and contain information about common contaminants, depth profiling and methods of actually performing the experiments.
 datasheets.pdf (161kb) |
| |
MiniSIMS User Training Course
This is a PDF of our current training presentation. This introductory course provides information on the software, acquiring SED images, mass spectra and ion images together with basic maintenance. There are several animations which are not replicated from the PowerPoint version, if you require this version please contact us in the normal manner.
MiniSIMS user training course.pdf (802kb) |
| |
MiniSIMS User Training Course - Advanced
This training course gives advanced information on further software features, depth profiling and analysis of insulating samples. There is also guidance about troubleshooting the instrument.
MiniSIMS user training course - Advanced.pdf (701kb) |
|
| External Data Sources |
| |
Isotope Ratio Viewer
A useful download available free from the SurfaceSpectra website, which calculates the overall peak intensities for any secondary ion cluster composed of elements with multiple isotopes.
www.surfacespectra.com/software/isotopes/index.html |
| |
Relative Atomic Masses
Atomic weights and isotopic compositions for all elements are listed at
http://physics.nist.gov/PhysRefData/Compositions/index.html |
| |
|
Particle Interactions with Matter
This website has a simulation program called SRIM available for free download. SRIM models the interaction of a primary ion with the surface atomic layers. In particular, it will estimate the sputter yield of the material. It also shows the penetration depth of the primary ion collision cascade, which gives an estimate of the atomic mixing that will occur in depth profile mode. The simple results appear to be accurate for elemental materials such as metals, but extra information is required for an accurate simulation of compounds and alloys.
This is a document which describes in detail how to use the SRIM program for use with the MiniSIMS.
SRIM use.pdf (22kb)
The Stopping and Range of Ions in Matter (www.srim.org)
|
